Polarized x-ray spectroscopy of quaternary ferromagnetic semiconductor (Ga,Mn)(As,P) thin films

X-ray magnetic circular dichroism (XMCD) is used to study the magnetic and electronic properties of the quaternary diluted magnetic semiconductor (Ga,Mn)(As,P) as a function of the P concentration y. A clear signature of the variation in strain, from compressive to tensile on increasing y, is observed in the angular dependence of the hybridized d5-like Mn L2,3 XMCD spectra. The ferromagnetic transition temperature and magnetic moment per Mn ion both decrease steadily with increasing y.