Single Crystal Synthesis and Characterization of Copper intercalated ZrTe5

Herein is presented the synthesis and characterization of copper intercalated zirconium pentatelluride (ZrTe5). ZrTe5:Cu0.05 crystals are synthesized by chemical vapor transport method in vacuum. X-ray diffraction (XRD) and elemental analysis techniques are utilized to validate the synthesis. The results indicate that the intercalation of the layered Zr/Te structure with copper atoms causes the contraction of the unit cell along all three crystalline directions and shrinkage of the overall volume of the unit cell, and a distortion of the unit cell. A single crystal was isolated, mechanically exfoliated, and used for the measurements of intercalation strains in a Hall bar device. Electronic transport studies indicate an anomalous resistance drop is observed at T = 19K. Furthermore, Rxx and Rxy results, respectively, indicate a probable disorder induced localization effect and electron type carriers.