FPD DEFECT DETECTION BASED ON WAVELET TRANSFORM FOR UNEVEN ILLUMINATION COMPENSATION

Due to the uneven illumination of panels it is difficult to quantify the defect so this paper propose the uneven illumination compensation method using wavelet based multi-resolution structure. First, the lowest low frequency and some high frequency bands from wavelet decomposition are removed to be reconstructed for compensating the uneven illumination. The simple thresholding technique is then applied to segment the defects. Finally, blob analysis as post-processing is performed to get rid of false defects.