A low noise infrared spot scanner for testing detector arrays

We have built a low noise spot scanner for use in testing the performance of infrared detector arrays for NASA's IR detector technology development program and the University of California's MICRO program. The scanner provides a convenient low noise detector test environment and a wide range of test conditions including versatile temperature control of the detector, ambient background, and blackbody source temperature and control of spot size, color, and brightness.© (1984) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.