Applications of X-Ray Absorption Spectroscopy in Materials Science

2004 
Short-range order information around a given atom obtained by the EXAFS (Extended X-ray Absorption Fine Structure) technique, concerning nanocrystalline materials, is reviewed. The potentialities of the technique to characterise bulk materials, thin films, and structural evolution during the preparation of nanoparticles using in situ set-ups are presented.
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