Probability of latching an SET in advanced technologies

R. C. Quinn,J. S. Kauppila,Kevin M. Warren,Y. P. Chen,B. L. Bhuva,M. Bounasser,K. Lilja,Lloyd W. Massengill

Probability of latching an SET in advanced technologies

2016

R. C. Quinn
J. S. Kauppila
Kevin M. Warren
Y. P. Chen
B. L. Bhuva
M. Bounasser
K. Lilja
Lloyd W. Massengill

Classical probability models have been found to underestimate or overestimate the SET latching frequency dependence. This work develops an improved model for transient latching probability and compares models using 32nm SOI SET data.

Keywords:

Electronic engineering
Silicon on insulator
Computer science
Data modeling
transient analysis
error analysis
frequency dependence

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