High-speed grating interferometry

We present the most recent advances in fast X-ray grating interferometer and their applications. A dedicated setup for rapid scanning with a single grating and using filtered broadband illumination of an undulator source has been implemented. With this setup tomographic scans can be achieved within minutes. Larger number of samples can be measured and chemical processes can be studied. Improvements in the data processing technique will be presented. We will also describe the new capabilities and applications.