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UHV STM/AFM/FIM for mechanical and electronic studies of single molecules
UHV STM/AFM/FIM for mechanical and electronic studies of single molecules
2004
Yan Lindsay Sun
Henrik Mortensen
Anne-Sophie Lucier
Sacha Schar
Peter Grutter
Keywords:
Molecule
Scanning probe microscopy
Electrochemical scanning tunneling microscope
Conductive atomic force microscopy
Atomic force microscopy
Field ion microscope
Scanning tunneling microscope
Atom
Analytical chemistry
Chemistry
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