Study of the optical properties of the amorphous Sb2S3 thin films
2010
Sb 2 S 3 thin films have been deposited by single source vacuum thermal evaporation onto glass substrates at various substrate temperatures in the range 30- 240 °C. The X-ray diffraction spectra indicated that all the as-deposited Sb 2 S 3 films were amorphous.The optical constants were obtained from the analysis of the experimental recorded transmission and reflectance spectral data over the wavelength range 300-1800 nm. It has been found that the refractive index dispersion data obeyed the single oscillator of the Wemple-DiDomenico model. By using this model, the dispersion parameters and the high-frequency dielectric constant were determined. The electric free carrier susceptibility and the carrier concentration on the effective mass ratio were estimated according to the model of Spitzer and Fan.
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