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MIMC Reliability and Electrical Behavior Defined by a Physical Layer Property of the Dielectric
MIMC Reliability and Electrical Behavior Defined by a Physical Layer Property of the Dielectric
2008
Rémy Charavel
J. Ackaert
K Dhondt
B. Vlachakis
L. De Schepper
M. Millecam
Eddy Vandevelde
Pierre Bogaert
E. De Backer
Anton Ilin
Alexandru Vlad
Jean-Pierre Raskin
Keywords:
Dielectric
Physical layer
Reliability engineering
Electronic engineering
Engineering
Electrical engineering
Correction
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