Measurement of Reflection Anisotropy of Polarized Light for Detecting Surface Perpendicular Orientation in MP-LIPS Tape

A rapid, non-destructive optical method for detecting the perpendicular orientation at the surface of metal LIPS tape is described. This technique uses reflection anisotropy due to the depolarization coefficient anisotropy of the acicular metal particles. A tape sample with low anisotropy according to this method of evaluation exhibited higher density wavelength response characteristics.