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Optical Interferometry of the 220 Repeat Distance in a Silicon Crystal
Optical Interferometry of the 220 Repeat Distance in a Silicon Crystal
1971
Richard D. Deslattes
Keywords:
Angle-resolved low-coherence interferometry
Interferometry
Monocrystalline silicon
Optics
White light interferometry
Materials science
Electronic speckle pattern interferometry
Correction
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