Tunneling studies of Nb/Al superconducting proximity-effect bilayers

Abstract Nb / Al AlO x Ti tunneling junctions with fixed Nb and Ti thicknesses of 200 nm and Al thickness ranging from 10 to 70 nm were fabricated. Preliminary results on the measurements of I – V characteristics at T = 1.3 K are reported, and are compared with a proximity-effect model recently proposed by Golubov et al. .