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Comparison Between A Posteriori Error Indicators For Adaptive Mesh Generation In Semiconductor Device Simulation
Comparison Between A Posteriori Error Indicators For Adaptive Mesh Generation In Semiconductor Device Simulation
1993
Katsuhiko Tanaka
P. Ciampohni
A. Pierantoni
G. Baccarani
Keywords:
Semiconductor device
Mesh generation
Very-large-scale integration
Charge-carrier density
Current density
Electronic engineering
Microelectronics
Computer science
National Electrical Code
A priori and a posteriori
Correction
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