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142101 Observation of individual dopants in a thin silicon layer by low temperature Kelvin Probe Force Microscope (3 pages)
142101 Observation of individual dopants in a thin silicon layer by low temperature Kelvin Probe Force Microscope (3 pages)
2008
Volodymyr A. Chernenko
B. Rajini Kanth
Pranab Kumar Mukhopadhyay
Santosh N. Kaul
Elizabeth Villa
Attilio Gambardella
S. Besseghini
Tianfu Zhang
Jeong Young Park
Wenyu Huang
Gabor A. Somorjai
Sukmin Chung
Tai-Hee Kang
Sang-Wook Cheong
Stefan Decoster
Bert J. M. de Vries
Ulrich Wahl
J. G. Correia
André Vantomme
Maciej Ligowski
Daniel Moraru
Miftahul Anwar
Takeshi Mizuno
Ryszard Jablonski
Michiharu Tabe
Wei Zheng Ren
Tae Ho Cho
T. C. Leung
Cliburn C. T. Chan
Ambesh Dixit
C. Sudakar
Ratna Naik
Gavin Lawes
Jagdish S. Thakur
Erik F. McCullen
Gregory W. Auner
Christian Ertler
Kuan Eng Johnson Goh
Y. Augarten
Lars Oberbeck
M. Y. Simmons
Yan Liu
Tu Pei Chen
W.-H. Zhu
Maojiang Yang
Z. H. Cen
Jared Wong
You-Bin Li
Shili Zhang
Xuan Chen
Keywords:
Dopant
Analytical chemistry
Kelvin probe force microscope
Chemistry
Silicon
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