X-ray topography investigation of La2−xSrxCuO4 single crystals

Abstract La 2− x Sr x CuO 4 (LSCO) single crystals have been studied by X-ray topography methods. Particularities of grain structure connected with the growth methods travelling solvent floating zone (TSFZ) and slow cooling (SC) are explored. It was found that average disorientation between grains for the TSFZ method is 0.2–0.3°. For the SC method, the disorientation varies from 0.01–0.03° up to 0.3° depending on cooling rate. It was shown that TSFZ grown LSCO single crystals are more preferable as substrates for liquid phase epitaxy technique.