Recent Experiments on the S-Band Coaxial Multipactor Test Cell*

Vacuum electronic devices that are exposed to oscillating electric fields can undergo multipactor discharges. During multipactor, radiofrequency electric fields accelerate free electrons into surfaces, causing them to undergo secondary electron emission [1] . These secondary electrons continue this process of acceleration and secondary emission, causing the electron population to multiply exponentially. The resultant electron cloud can cause a number of deleterious effects. Multipactor causes signal attenuation, cavity loading, and reduces the signal quality [2] . The repeated electron impacts can even cause localized heating, potentially leading to catastrophic damage to the device.