ION BEAM MODIFICATION OF PES, PS AND PVC POLYMERS

Abstract MeV ions passing through polymer films modify their electrical and optical properties and these changes are related to changes in the chemical structures of the polymers. The effects of certain cross linking enhancers, such as sulfur and other pendant molecules, on the ion beam modification process were investigated. Stacked, thin films of polyethersulfone, polyvinyl chloride and polystyrene were bombarded with MeV helium ions and the induced changes in the chemical structure of the polymers were studied with Raman microprobe analysis and RBS combined with in situ residual gas analysis. FTIR spectroscopy was used to categorize the changes in the optical properties. The results were then compared with those from previously studied polyethylene and polyvinylidene chloride polymers.