Determination of profile parameters of planar waveguides

Research Center "S.I.Vavilov State Optical Institute"199034, St.-Petersburg, RussiaABSTRACTThe simple nondestructive method for reconstruction of the refractive index distribution in the waveguidecross section is presented. Sample surface immersing and the interferometric method of registration are utilizedin this technique.Keywords: Integrated optics, planar waveguide.1. INTRODUCTIONThe refractive index (RI) distribution profile in the waveguide (WG) cross section is a basic characteristicsetting the properties of the WG as an informational system element. The modal and wavelength spectra, theWG cross sizes, the values of mode propagation constants and the light intensity distribution in the WG cross