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New method of electron beam transverse size measurement by angular distribution of emission in a thin crystal
New method of electron beam transverse size measurement by angular distribution of emission in a thin crystal
2019
Yu.A. Goponov
S. A. Laktionova
R. A. Shatokhin
M.A. Sidnin
K. Sumitani
Y. Takabayashi
I. E. Vnukov
Keywords:
Optics
Transverse plane
Cathode ray
Materials science
size measurement
thin crystal
angular distribution
Correction
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