Heavy Ion Single Event Latchup Measurements of a Focal Plane Imager at Room and Cryogenic Temperatures

Heavy ion-induced Single Event Latchup (SEL) is characterized in a CMOS focal plane array Readout Integrated Circuit (ROIC) at room temperature and 225 K. The LET threshold at room temperature is between 22 and 24 MeV-cm2/mg. The part is SEL immune at 225 K.