BEAM DIAGNOSTIC SYSTEM FOR PAL-XFEL

The XFEL project in Pohang Accelerator Laboratory (PAL) requires low beam-emittance, ultra-short bunch length, high peak current, high stability of beam energy, and measurement and steering of beam trajectory within micrometers. Therefore, beam diagnostics for the selfamplified stimulated emission (SASE) XFEL should be, focused on attaining femto-second precision in the measurement of temporal beam parameters, and submicrometer precision in beam position measurement. Charge measurement and energy measurement are important as well. In this work, technical concepts regarding the diagnostic monitors will be summarized and present status of them will be described.