Corrigendum to “Electrical transport and structural study of CuCr1 − xMgxO2 delafossite thin films grown by pulsed laser deposition” [Thin Solid Films 517 (2009) 3211–3215]

The author regrets that during the publication of this paper an error occurred within the text of Section 3 andwithin figure. The corrected text and figure is reproduced below. Increasing the alloy percentage of Mg decreases the c-axis lattice parameter of the CuCr1− xMgxO2 phase in a basically linear fashion. Fig. 4 shows this trend, despite the fact thatMg forms a largerMg(II) cation in 6-fold coordination (with a 0.86 A radius) than the Cr(III) cation in 6-fold coordination (with a 0.75 A radius) otherwise sitting on its site. The c-axis lattice parameter is known to be almost independent of M(III) metal choice and this trend is thus likely a verification of the presence of holes sitting on Cu(I) lattice sites.