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Detection of structural tree defects using thermal infrared imaging
Detection of structural tree defects using thermal infrared imaging
2020
Coco Yin Tung Kwok
Man Sing Wong
Hon Li
Karena Ka Wai Hui
Florence W.Y. Ko
Herman Yiu Kay Shiu
Zihan Kan
Keywords:
Optoelectronics
Materials science
thermal infrared
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