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Avalanche‐Induced Hot Electron Injection and Trapping in Gate Oxides on p‐Si
Avalanche‐Induced Hot Electron Injection and Trapping in Gate Oxides on p‐Si
1980
A. K. Sinha
W.S. Lindenberger
W.D. Powell
E. I. Povilonis
Keywords:
Chemistry
Inorganic chemistry
Hot-carrier injection
Trapping
Analytical chemistry
Correction
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