Calibration of a multilayer semiconductor spectrometer using α sources

A method for calibrating a multilayer spectrometer using α particles is presented. This spectrometer is composed of successive semiconductor Si(Li) detectors and is used for precision detection of long-range charged particles (p, d, and t) with energies of ∼100 MeV. The factors affecting the accuracy of calibration are analyzed. This method is shown to guarantee high accuracy in measuring charged-particle energies.