Ferromagnetic resonance study of sputtered Pt/Co/Pt multilayers

Abstract We report on broadband ferromagnetic resonance studies of [ Pt tPt / Co tCo / Pt tPt ] N multilayer thin films, using a flip-chip method with a high frequency coplanar waveguide at room temperature. We investigate the dependence of the magnetic parameters of thin films, namely the Gilbert damping constant α , the effective magnetization M eff and Lande g -factor on both the Pt layer thickness ( 0.9 nm ⩽ t Pt ⩽ 2.7  nm) and the thickness of the Co layers ( 1.2 nm ⩽ t Co ⩽ 11.3  nm). Moreover, the effect of different stacking numbers N on the film parameters is studied.