Old Web
English
Sign In
Acemap
>
Paper
>
Measurements of proton upset induced in CMOS devices: Synthesis of CEA studies
Measurements of proton upset induced in CMOS devices: Synthesis of CEA studies
1991
D. Mijuin
Jacques Buisson
Thierry Chapuis
J.-P. Brunet
Jean Claude Murat
G. Milleret
Keywords:
Radiation effect
Nuclear engineering
Upset
Synchrotron radiation
CMOS
Single event upset
Nuclear physics
Proton
Materials science
Correction
Cite
Save
Machine Reading By IdeaReader
0
References
4
Citations
NaN
KQI
[]