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Investigation of Compositional Inhomogeneity of InGaN using Transmission Electron Microscopy (초)
Investigation of Compositional Inhomogeneity of InGaN using Transmission Electron Microscopy (초)
2008
박지원
백성일
고동수
김희진
박성현
윤의준
김영운
Keywords:
Phase (matter)
Transmission electron microscopy
Nitride
Materials science
Analytical chemistry
Optoelectronics
Correction
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