Nonlinear characteristics of super resolution chalcogenide thin film

A third order nonlinear optical material, As 2 Se 3 was proposed for super resolution near field structure disk. As 2 Se 3 was deposited by thermal evaporation technique. Composition, phase, surface morphology, linear/non-linear optical properties were obtained from EPMA, XRD, AFM, UV-VIS-NIR spectrophotometer and VASE. As 2 Se 3 thin film showed large non-linear optical characteristics ( X R (3) =7.42×10 -7 m 2 /w, γ=1.268×10 -5 m 2 /w) and self-focusing phenomenon. Super resolution effects of the As 2 Se 3 thin films were measured by using the laser beam profiler. As a result, recording density can be enhanced by 2.3 times, in case of 350nm As 2 Se 3 thin film was deposited as super-RENS.