X-ray imaging system for X-ray image at high frequencies of an object to be examined by means of direct measurement of the interference pattern

The invention relates to an X-ray exposure system for X-ray imaging of an examination object (6) by direct measurement of an interference pattern (18), in particular for differential real-time phase contrast imaging, with at least one X-ray source (3) for producing quasi-coherent X-rays, an X-ray image detector (4), having a detector layer (21) and arranged in a matrix detector pixels (22), a diffractive or phase grating (17) which is arranged between the object to be examined (6) and the X-ray image detector (4) and generates an interference pattern (18) is detected in the n-th Talbotordnung directly by an X-ray image detector (4) with a very high achievable spatial resolution, which is at least half the wavelength of the resulting in the n-th Talbotordnung interference pattern (18) in accordance with the Nyquist theorem.