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The rapid response of 2/1 tearing mode to electrode biasing in J-TEXT experiments
The rapid response of 2/1 tearing mode to electrode biasing in J-TEXT experiments
2018
T. Wang
Z. Chen
Q. Hu
Q. Yu
H Liu
M. Huang
J. Yang
D. Li
Y. Huang
D. Guo
Z. Huang
Z. Cheng
L. Zhu
Z. Yang
J-Text Team
Keywords:
Tearing
Biasing
Optoelectronics
Electrode
Materials science
Correction
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