Raman validity for crystallite size La determination on reticulated vitreous carbon with different graphitization index

Abstract The graphitization index provided by X-ray diffraction (XRD) and Raman spectrometry for reticulated vitreous carbon (RVC) substrates, carbonized at different heat treatment temperatures (HTT), is investigated. A systematic study of the dependence between the disorder-induced D and G Raman bands is presented. The crystallite size L a was obtained for both X-ray diffraction and Raman spectrometry techniques. Particularly, the validity for L a determination, from Raman spectra, is pointed out comparing the commonly used formula based on peaks amplitude ratio ( I D / I G ) and the recent proposed equation that uses the integrated intensities of D and G bands. The results discrepancy is discussed taken into account the strong contribution of the line broadening presented in carbon materials heat treated below 2000 °C.