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Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit
Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit
2006
Gilles Tessier
S. Pavageau
C. Filloy
B. Charlot
G. Jerosolimski
D. Fournier
B. Cretin
N. Trannoy
P. Vairac
Séverine Gomès
S. Dilhaire
Sebastian Volz
Keywords:
Calibration
Analytical chemistry
Integrated circuit
Electronic engineering
Materials science
thermal mapping
Remote sensing
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