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Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS
Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS
2021
Jialei
Wang
Jeffrey
Prinzie
Andrea
Coronetti
Sam
Thys
Alia
Ruben
Paul
Leroux
Keywords:
Optoelectronics
CMOS
Large Hadron Collider
Static random-access memory
Radiation monitoring
Voltage
Materials science
sensitivity
Neutron
heavy ion
Correction
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