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Surface characterisation by near-field microscopy and atomic force microscopy
Surface characterisation by near-field microscopy and atomic force microscopy
2002
A. Cricenti
R. Generosi
M. Luce
P. Perfetti
G. Margaritondo
D. Talley
Jasbinder S. Sanghera
Ishwar D. Aggarwal
Jonathan Mark Gilligan
N. H. Tolk
Keywords:
Near-field scanning optical microscope
Composite material
Atomic force microscopy
Materials science
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