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The Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) on GOES-16: Measurements, Data Products, and First Results
The Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) on GOES-16: Measurements, Data Products, and First Results
2017
F. Epavier
Thomas N. Woods
Andrew R. Jones
Martin Snow
Donald L. Woodraska
Edward Thiemann
William E. McClintock
Michael Anfinson
Rodney Viereck
J. L. Machol
Monica Todirita
Gustave J. Comeyne
Sivakumara K. Tadikonda
Keywords:
Irradiance
data products
X-ray
Extreme ultraviolet
Materials science
Optics
Correction
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