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Characterization of 16 MegaPixel CMOS Detector for TEM by Evaluating Single Events of Primary Electrons
Characterization of 16 MegaPixel CMOS Detector for TEM by Evaluating Single Events of Primary Electrons
2011
R Ghadimi
I Daberkow
C Kofler
P Sparlinek
Hr Tietz
Keywords:
Detector
Analytical chemistry
CMOS
Materials science
Electron
Nanotechnology
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