Defect Evolution in Multiwalled Carbon Nanotube Films Irradiated by Ar Ions
2012
Controlling defect structure in multiwalled carbon nanotube (MWCNT) is essential to realization of MWCNT devices. Here, we show that the diagram of the Raman intensity ratio of the G to D peaks and the G peak width can reveal two damaging stages of MWCNT films. In a transition period, additional peaks appeared in the X-ray absorption spectra, thereby indicating some significant change in the electronic structure. Also, a remarkable increase occurred in the diameter of the MWCNTs in the latter stage, suggesting the formation of dislocation dipoles which may relate to the change in the properties of field-emission devices.
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