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Multi-Point Probing on 65nm Silicon Technology using Static IREM-based Methodology
Multi-Point Probing on 65nm Silicon Technology using Static IREM-based Methodology
2005
Daniel R. Bockelman
Asifur Rahman
Ifar Wan
Steven Y. C. Chen
Scott M. Ettinger
Keywords:
Electronic engineering
multi point
Computer science
Silicon
Correction
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