Chip and method testing chip

The invention provides a chip and a method testing the chip. The method testing the chip includes that a first transmitting device receives a first test signal which is sent by a test device, converts the first test signal into a second test signal, and sends the second test signal to the exterior of the chip. A first receiving device receives the second test signal, and forwards the second test signal to a second transmitting device. The second transmitting device receives the second test signal, converts the second test signal to a third test signal, and sends the third test signal to the exterior of the chip. The second receiving device receives a third test signal, and returns to a test device. The test device compares whether the third test signal is consistent with the first test signal, if the third test signal is consistent with the first test signal, the function and performance of the chip are correct. The first test signal, the second test signal and the third test signal form a loop outside the chip, and a test path can be adopted to test whether function and performance of multiple devices are correct or not.