Electrical and structural characterisation of single ZnO nanorods

Zinc oxide (ZnO) nanorods grown by vapor transport were contacted individually with Ti/Au electrodes structured by e-beam lithography. The rectifying behaviour observed in the current-voltage characteristics is likely caused by an interfacial insulating layer between the ZnO nanowires and the contact material. Energy-dispersive X-ray spectroscopy (EDX) measurements performed on electrically measured and non measured reference nanowires reveal that no electromigration of Au or Ti into the nanowires occurs.