CONTROLS AND DIAGNOSTICS FOR THE HIGH CURRENT ELECTRON BEAM ION SOURCE AT BNL

The BNL EBIS Test Stand (EBTS), is a full electron beam power, half ion trap length prototype for an Electron Beam Ion Source (EBIS) that could meet requirements for the Relativistic Heavy Ion Collider (RHIC) preinjector. (1). The EBTS uses a 10 A, ~50 ms pulsed electron beam to produce intense pulses of highly charged ions, of ~55 nC total positive charge yield and as short as 10 µs duration. An auxiliary ion source is used to inject primary low charged Au ions into the EBTS in ~500 µs pulses. The EBIS controller handles all the digital timing and many analog control signals used for power supply and device control necessary, for stable, low loss EBIS operation. Diagnostics used to monitor the electron and ion beams include Faraday cups, current transformers, a Mamyrin TOF for providing high resolution ion spectra for highly charged heavy ions (e.g., Au34+) at 20 kV extraction energy, harp-type beam profile monitors and a compact emittance head. The design and operation of these devices will be discussed.