UNCONVENTIONAL TESTER FOR THE VERIFICATION OF GTO-MODEL-PAPAMETERS AND FOR THE INVESTIGATION OF THE CURRENT DENSITY DISTRIBUTION IN GTO TABLETS

This paper describes the main features of an unconventional tester for high power semiconductor devices. Two application ranges are highlighted. The tester is used for the extraction of GTO parameters and their verification by measurements. The second field comprises the determination of the radial and azimuthal current density distribution of a GTO tablet. The results are compared with the carrier lifetime distribution.