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Modern X-ray and optical systems for monitoring components in the atomic industry
Modern X-ray and optical systems for monitoring components in the atomic industry
1998
P. I. Lavrenyuk
V.V. Rozhkov
Yu. K. Karlov
Yu. A. Zhukov
I. G. Chapaev
A. K. Potashnikov
Yu. V. Chuguĭ
Keywords:
Nuclear chemistry
Chemistry
Mineralogy
X-ray
Molecular physics
Optics
Radiochemistry
Nanotechnology
Correction
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