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CONSIDERATIONS FOR OPTIMIZING PRECISION AND ACCURACY OF MULTILAYER THIN FILM MEASUREMENTS — Invited
CONSIDERATIONS FOR OPTIMIZING PRECISION AND ACCURACY OF MULTILAYER THIN FILM MEASUREMENTS — Invited
2003
A. Wittkopp
Keywords:
Chemistry
Accuracy and precision
Crystallography
Thin film
Analytical chemistry
Optoelectronics
Mineralogy
Correction
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