A Featural Analysis of Aluminium Doped SnO2 and Bare SnO2 Thin Films Grown on FTO Substrates

Abstract Nanomaterials when developed as thin films exhibit better properties compared to nanoparticles. Tin oxide with its outstanding properties such as wide band gap, low electrical resistivity, and good chemical stability is a versatile material in the field of nanomaterials. Metal doped SnO 2 in addition exhibits enhanced properties. We report herein the preparation and analysis of the important properties of Al doped and pure SnO 2 thin films through a simple sol-gel process and subsequent spin coating on FTO substrates. Microstructural characterization of the thin films was carried out for comparative evaluation of their physical properties. The as-grown thin films were studied using powder XRD technique and the crystallite sizes were estimated for Al doped and bare SnO 2 thin films. The surface morphologies of the as-synthesized thin films were examined using High Resolution Scanning Electron Microscope. The observed images indicated lesser agglomeration and good homogeneity in the case of Al doped SnO 2 thin films in comparison with its pure counterpart. The surface area, pore volume and pore radius of the samples were determined using BET analysis. The Fourier Transform Infrared Spectroscopy evidenced the presence of the various functional groups related to the materials of the films.