Lifetime measurements using the Jefferson Lad Load-Lock Electron Gun

Lifetime measurements of bulk GaAs using a 100 kV load-lock electron gun and beam line were made. Initial tests used anodized samples to study lifetime under various conditions (gun vacuum, laser spot location, activated area). Subsequent tests used a mechanical mask to limit the active area and included improved monitoring of the gun chamber and beam line vacuum pressure. Results of these measurements support claims made at past workshops, namely photocathode lifetime improves when gun vacuum is enhanced and when electron emission from the edge of the photocathode is eliminated. The dependence upon laser spot location is less certain. Tests studying lifetime at higher beam intensity (I ~ 8 mA) have begun.