Analysis and research on failure of a certain nor FLASH for aerospace use

The paper has analyzed the problems discovered in the application validation of a certain NOR FLASH for aerospace use, and clarified that the failure of this FLASH belongs to bit interference caused by over-erase. At the same time, the failure mechanism has also been analyzed, which is found to be discreteness of chip manufacturing process and incomplete coverage of the test; additionally, evasion measures in the application, product improvements and targeted test methods are also proposed.