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Atomic Force Scanning Electrochemical Microscopy (AFM-SECM) for Electrochemical Imaging at the Nanoscale
Atomic Force Scanning Electrochemical Microscopy (AFM-SECM) for Electrochemical Imaging at the Nanoscale
2007
J-S Moon
Justyna Wiedemair
J-F Masson
Boris Mizaikoff
Christine Kranz
Keywords:
Electrochemical scanning tunneling microscope
Analytical chemistry
Electrochemistry
Conductive atomic force microscopy
Atomic force microscopy
Nanoscopic scale
Scanning electrochemical microscopy
Scanning capacitance microscopy
Materials science
Nanotechnology
electrochemical imaging
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